A unified class of process capability indices for asymmetric tolerances and non-normal data

Shixiang Li, Sheng Fu, Dianpeng Wang, Piao Chen*

*此作品的通讯作者

科研成果: 期刊稿件文章同行评审

摘要

Process capability analysis plays a critical role in quality control by evaluating how well manufacturing processes meet defined specifications. However, traditional process capability indices (PCIs) rely on assumptions of symmetric tolerances and normally distributed data, which often do not hold in real-world applications and can lead to misleading conclusions. To overcome these limitations, we propose two novel classes of PCIs designed specifically for asymmetric tolerances, complemented by parametric estimation procedures and asymptotic confidence limits. To address the issue of non-normal data, we further employ an inverse transformation via constrained B-spline regression, which removes the need for the normality assumption. We demonstrate that our proposed PCIs reduce to traditional indices under symmetric conditions and normal data while extending applicability to a broader range of cases. Numerical simulations and a real-world application in an electronics company confirm the effectiveness and practical utility of our approach.

源语言英语
页(从-至)200-219
页数20
期刊Journal of Quality Technology
57
3
DOI
出版状态已出版 - 2025
已对外发布

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